Wszystkie pola: Prasad, S. V. S. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Dielectric studies of nano structured BaTi_1-xSn_xO₃ solid solutions
Autorzy:: Bitra, H. Ch. R.
Prasad, B. B. V. S. V.
Powiązania:: https://bibliotekanauki.pl/articles/412300.pdf
Data publikacji:: 2014
Wydawca:: Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:: BTSx
XRD
SEM
dielectric constant
Opis:: BaTi_1-xSn_xO₃ (BTSx) ceramics had been prepared by temperature sintering technique. Initially, the samples were calcined at a temperature at 900 °C for 2 hours, after that ball milling was done and then the samples were sintered at a temperature of 1150 °C for 3 hours. X-ray diffractometry, Scanning Electron Microscopy, Energy Dispersive Spectroscopy and Dielectric measurements were carried out and structural, micro structural and elemental analyses were discussed in brief.
Źródło:: International Letters of Chemistry, Physics and Astronomy; 2014, 13, 2; 191-201
2299-3843
Pojawia się w:: International Letters of Chemistry, Physics and Astronomy
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: On a method to employ Newton’s Rings concept to determine thickness of thin films
Autorzy:: Raveesha, K. H.
Doddamani, V. H.
Prasad, B. K.
Powiązania:: https://bibliotekanauki.pl/articles/412571.pdf
Data publikacji:: 2014
Wydawca:: Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:: Interference
fringes
destructive interference
constructive interference
air wedle
Opis:: Newton’s Rings experiment is traditionally utilized to find radius curvature of a lens. We propose a method in which this same set up can be used to find the thickness of thin films. The working principle is interference. It is based on the fact that, the formation of bright and dark interference fringes is a measure of the thickness of the air film at that point. We present the experimental data. The results from the experiment are in agreement with results obtained through geometry. Further, a method to improvise conventional interference at air wedge experiment which is generally used to determine the thickness of thin films is suggested.
Źródło:: International Letters of Chemistry, Physics and Astronomy; 2014, 3; 1-7
2299-3843
Pojawia się w:: International Letters of Chemistry, Physics and Astronomy
Dostawca treści:: Biblioteka Nauki

Artykuł

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