Wszystkie pola: test bench - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Automatic Test Bench for Selected Transmission Parameters of Power Line Conductors
Autorzy:: Chruszczyk, Ł.
Powiązania:: https://bibliotekanauki.pl/articles/227032.pdf
Data publikacji:: 2015
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: LabVIEW
power line measurements
power line communication
amplitude spectrum
phase spectrum
crosstalk measurement
Opis:: This paper presents automatic test bench used for measurement of selected high frequency parameters of a power copper line. The aim is fast estimation of line behavior in context of Power Line Communication (PLC). The hardware interface uses sinusoidal waveform generator, digital oscilloscope and a PC-class computer. The software interface created in LabVIEW environment performs signal processing and data presentation.
Źródło:: International Journal of Electronics and Telecommunications; 2015, 61, 1; 59-65
2300-1933
Pojawia się w:: International Journal of Electronics and Telecommunications
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Experimentally test bench for Tire Pressure Monitoring System : discussion of measurement and communication issues
Autorzy:: Gryś, Sławomir
Powiązania:: https://bibliotekanauki.pl/articles/227130.pdf
Data publikacji:: 2019
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: automotive technology
driving safety
temperature and pressure measurements
calibration
Opis:: This paper presents a method of wireless measurement of pressure and temperature of air in a car wheel with Tire Pressure Monitoring System - one of the modern safety systems used in the automotive industry. The readings were performed on a specially designed test bench. It was described a construction and operating principle of key elements of this test bench allowing work with sensors, TPMS module, reference instruments, and the format of data and correctness of data transmission between TPMS and host computer. The created software for embedded system emulating real on-board computer let to observe the uncorrected sensor readings and the effect of calibration in two points of characteristic.
Źródło:: International Journal of Electronics and Telecommunications; 2019, 65, 1; 51-56
2300-1933
Pojawia się w:: International Journal of Electronics and Telecommunications
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Build Testbenches for Verification in Shift Register ICs using SystemVerilog
Autorzy:: Widianto, M.
Chasrun, H.
Lis, Robert
Powiązania:: https://bibliotekanauki.pl/articles/2134048.pdf
Data publikacji:: 2022
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: test bench
verification
shift register IC
stuck-at-faults
SystemVerilog
Opis:: A testbench is built to verify a functionality of a shift register IC (Integrated Circuit) from stuck-at-faults, stuck-at-1 as well as stuck-at-0. The testbench is supported by components, i.e., generator, interface, driver, monitor, scoreboard, environment, test, and testbench top. The IC consists of sequential logic circuits of D-type flip-flops. The faults may occur at interconnects between the circuits inside the IC. In order to examine the functionality from the faults, both the testbench and the IC are designed using SystemVerilog and simulated using Questasim simulator. Simulation results show the faults may be detected by the testbench. Moreover, the detected faults may be indicated by error statements in transcript results of the simulator.
Źródło:: International Journal of Electronics and Telecommunications; 2022, 68, 3; 619--623
2300-1933
Pojawia się w:: International Journal of Electronics and Telecommunications
Dostawca treści:: Biblioteka Nauki

Artykuł

Informacja