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Wyszukujesz frazę "Chudy, A." wg kryterium: Autor


Wyświetlanie 1-2 z 2
Tytuł:
Evaluation of the quality of titanium oxide and copper oxide layers by means of optical microscopy
Autorzy:
Głuszek, A.
Sawicka-Chudy, P.
Wisz, G.
Sibiński, M.
Cholewa, M.
Powiązania:
https://bibliotekanauki.pl/articles/101772.pdf
Data publikacji:
2018
Wydawca:
Instytut Polityki Energetycznej im. Ignacego Łukasiewicza
Tematy:
titanium oxide
copper oxide
optical microscopy
histograms
Opis:
The aim of this paper is to analyse high-resolution optical images of the surface layers of titanium oxide and copper oxide. The materials were produced using the PREVAC Modular Platform for layer deposition located at the University of Rzeszów. Images with a magnification of 50x were obtained using an optical microscope. On the basis of the results obtained, the quality of the layers was evaluated based on the image analysis. The quantitative method of analysis was applied, as a result of which the conditions of the manufacturing process for which the obtained layers had the highest homogeneity were indicated. The minimum range of grey shade counting was from 65 to 150 and the maximum range from 135 to 220. The standard deviation was from 8 to 40%.
Źródło:
Energy Policy Studies; 2018, 1 (2); 39-51
2545-0859
Pojawia się w:
Energy Policy Studies
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Analysis of chemical and phase composition of copper oxide prepared by direct current sputtering for photovoltaic applications
Autorzy:
Sawicka-Chudy, P.
Wielgosz, M.
Wal, A.
Cieniek, B.
Wisz, G.
Głowa, Ł.
Cholewa, M.
Sawicka, J.
Powiązania:
https://bibliotekanauki.pl/articles/101735.pdf
Data publikacji:
2018
Wydawca:
Instytut Polityki Energetycznej im. Ignacego Łukasiewicza
Tematy:
XRF
XRD
copper oxide
photovoltaics
Opis:
This paper presents the application of X-ray fluorescence and X-ray diffraction methods for the study of copper oxide structures as an absorber layer in thin-film solar cells. The layers of copper oxide were applied by direct current magnetron sputtering. Quantitative and qualitative analysis of oxide layers were performed using XRF (X-ray fluorescence). The studies showed a high copper content in both samples, amounting to 98% and 96%, as well as trace amounts of other elements (nickel, lead). The XRD (X-ray diffraction) study showed Cu20 and Cu8O phases, amorphism ranging from 24% to 44%, and crystallinity from 55% to 75%. Crystallites of 30 nm were also determined. The aim of the study was to determine the chemical and phase composition of the layers obtained and to determine the degree of their contamination depending on the parameters of the manufacturing technology in terms of their application in photovoltaics. One of the samples showed an advantage both in terms of material and structural composition.
Źródło:
Energy Policy Studies; 2018, 1 (2); 3-11
2545-0859
Pojawia się w:
Energy Policy Studies
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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