Temat: stochastic processes - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Analysis of linear random dynamical systems with variable coefficient
Autorzy:: Mazurkiewicz, S.
Walczak, J.
Powiązania:: https://bibliotekanauki.pl/articles/97218.pdf
Data publikacji:: 2014
Wydawca:: Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
Tematy:: moments of stochastic processes
LTV system
Opis:: In the article a linear model of n-th order dynamical systems described by the state equation with variable coefficients is considered. This model is analysed for a random initial condition and a random force. The method of determining the probabilistic characteristics of a stochastic process, which is the solution of that equation, is shown.
Źródło:: Computer Applications in Electrical Engineering; 2014, 12; 38-44
1508-4248
Pojawia się w:: Computer Applications in Electrical Engineering
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: The comparison of two supercapacitors lifetime estimated on the basis of accelerated degradation tests by means of stochastic models
Autorzy:: Kopka, R.
Tarczyński, W.
Powiązania:: https://bibliotekanauki.pl/articles/97606.pdf
Data publikacji:: 2016
Wydawca:: Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
Tematy:: supercapacitor
accelerated degradation tests
degradation processes
stochastic differential models
reliability
Opis:: The paper presents the results of the comparison of the lifetime estimation of two supercapacitors on the basis of the accelerated degradation tests by means of stochastic differential models. The acceleration of degradation processes was fulfilled by the increase of the operating voltage of the capacitors, while their reliability was assessed on the basis of the changes in equivalent series resistance. The reliability distribution function was determined using stochastic differential models. The model parameters were assessed based on the changes of supercapacitor parameter at the beginning of the testing process. In order to eliminate the effect of other factors accelerating the ageing process, supercapacitors were placed in a temperature chamber that provided a constant temperature during the tests. The paper describes the construction of the test setup, the tests procedure, and the method of reliability estimation. The use of two capacitors with different nominal voltages allowed for assessment of properties of particular parts of the test setup, as well as the proposed procedure for the tests and analysis of the results.
Źródło:: Computer Applications in Electrical Engineering; 2016, 14; 77-88
1508-4248
Pojawia się w:: Computer Applications in Electrical Engineering
Dostawca treści:: Biblioteka Nauki

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