- Tytuł:
- Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis
- Autorzy:
-
Babicz, S.
Smulko, J.
Zieliński, A. - Powiązania:
- https://bibliotekanauki.pl/articles/199918.pdf
- Data publikacji:
- 2013
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
atomic force microscopy (AFM)
harmonics
van der Waals forces - Opis:
- Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its non-linear response. The first studies of spectrum showed that presence of the second and the third harmonics in cantilever vibrations may be observed and used as a new method of the investigated samples characterization.
- Źródło:
-
Bulletin of the Polish Academy of Sciences. Technical Sciences; 2013, 61, 2; 535-539
0239-7528 - Pojawia się w:
- Bulletin of the Polish Academy of Sciences. Technical Sciences
- Dostawca treści:
- Biblioteka Nauki
Artykuł