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Wyszukujesz frazę "Thin Film" wg kryterium: Temat


Wyświetlanie 1-3 z 3
Tytuł:
Influence of pH on the Structural and Optical Properties of Polycrystalline MnTe₂ Thin Films Produced by Chemical Bath Deposition Method
Autorzy:
Kariper, İ.
Göde, F.
Powiązania:
https://bibliotekanauki.pl/articles/1031481.pdf
Data publikacji:
2017-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
X-ray diffraction
thin film
optical constant
growth from solutions
Opis:
Polycrystalline manganese ditelluride (MnTe₂) thin films are synthesized on commercial glass substrates by chemical bath deposition technique at different pH values (pH = 9, 10, 11 and 12). The effect of pH on the structural and optical properties of chemically deposited MnTe₂ thin films have been investigated in this study. The structure and optical properties of the films are characterized by X-ray diffraction and optical absorption spectroscopy. The X-ray diffraction results suggest that the films are polycrystalline with a mixture of dominant cubic MnTe₂ phase and few traces of orthorhombic MnTeO₃ and MnTe₂O₅ phases. The optical band gap of the films increases approximately from 1.66 eV to 2.62 eV with increasing pH. Moreover, optical parameters of the films such as refractive index, extinction coefficient, real and imaginary dielectric constants are investigated using absorption and transmittance spectra taken from the UV-vis spectrophotometer. At 600 nm wavelength, refractive index and extinction coefficient values vary in the range of 1.39-1.55 and 0.17-0.23, respectively. An increase in optical band gap could be attributed to the quantum confinement effect.
Źródło:
Acta Physica Polonica A; 2017, 132, 3; 531-534
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of Complexing Agent on the Structural, Optical and Electrical Properties of Polycrystalline Indium Sulfide Thin Films Deposited by Chemical Bath Deposition
Autorzy:
Göde, F.
Kariper, İ.
Güneri, E.
Ünlü, S.
Powiązania:
https://bibliotekanauki.pl/articles/1031534.pdf
Data publikacji:
2017-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
scanning electron microscopy
thin film
optical constant
growth from solutions
Opis:
Indium sulfide (β-In₂S₃) thin films are synthesized by chemical bath deposition method using three different complexing agent volumes, triethanolamine (TEA) (0.30, 0.45, and 0.60 ml). The effect of complexing agent on the structural, morphological, optical and electrical properties of chemically deposited indium sulfide (β-In₂S₃) thin films have been investigated in this work. The characterization of the present films is carried out using X-ray diffraction, scanning electron microscopy, UV-vis spectroscopy and electrical measurements. The structure of the films is polycrystalline with a cubic phase of β-In₂S₃. Firstly, the band gap of the film decreases from 3.74 eV to 3.15 eV by adding 0.30 ml TEA. Then, it increases to 3.79 eV with increasing TEA. Nevertheless, previously, the refractive index of the films increases from 2.13 to 2.67 for the 0.30 mL TEA and then it decreases to the value of 2.11 with increasing TEA. Extinction coefficient, real and dielectric constant of the films are calculated using the absorption and transmittance spectra. Firstly, the electrical resistivity of the films decreases from 3.46×10⁸ Ω cm to 1.33×10⁷ Ω cm by adding 0.30 ml TEA. Then, it increases to the value of 2.16×10⁹ Ω cm with increasing TEA. Eventually, the more conductive film with worm-like morphology detected from the scanning electron microscopy is synthesized using 0.30 ml TEA. These results show that complexing agent has an important effect on the structural, morphological, optical and electrical properties of the deposited films.
Źródło:
Acta Physica Polonica A; 2017, 132, 3; 527-530
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of Cu²⁺ Ion Irradiation on Microstructure of Er₂O₃ Coating Layer Formed by MOCVD Method
Autorzy:
Tanaka, M.
Takezawa, M.
Hishinuma, Y.
Tanaka, T.
Muroga, T.
Ikeno, S.
Lee, S.
Matsuda, K.
Powiązania:
https://bibliotekanauki.pl/articles/1032912.pdf
Data publikacji:
2017-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
nuclear fusion
coating
Er2O3
thin film
TEM
SEM and XRD
Opis:
Erbium oxide (Er₂O₃) coating is one of the promising methods to restrict tritium permeation and the magneto hydrodynamic pressure drop for advanced breeding blanket systems. Er₂O₃ coating layer on large interior surface area of metal pipe is deposited by using metal organic chemical vapor deposition process. In this work, the influence of Cu²⁺ ion irradiation on microstructure of Er₂O₃ coating layer on stainless steel 316 (SUS 316) substrate by metal organic chemical vapor deposition methods was investigated using scanning electron microscopy, transmission electron microscopy observation and X-ray diffraction analysis. Microstructure observation of Er₂O₃ coating was carried out after 0.00-1.50 dpa Cu²⁺ ion irradiation at 298 K and 773 K. Scanning electron microscopy observation of the surface area on Er₂O₃ thin film revealed the crack generation on surface after Cu²⁺ ion irradiation. X-ray diffraction peaks were identified in Er₂O₃ after Cu²⁺ ion irradiation transmission electron microscopy observations, the formation of interlayer between Er₂O₃ coating and SUS substrate was confirmed. According to transmission electron microscopy-energy dispersive spectroscopy, the interlayer includes Fe and Cr.
Źródło:
Acta Physica Polonica A; 2017, 131, 5; 1351-1352
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-3 z 3

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