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Wyświetlanie 1-3 z 3
Tytuł:
Barrier in the valence band in the nBn detector with an active layer from the type-II superlattice
Autorzy:
Kopytko, Małgorzata
Gomółka, Emilia
Manyk, Tetiana
Michalczewski, Krystian
Kubiszyn, Łukasz
Rutkowski, Jaroslaw
Martyniuk, Piotr
Powiązania:
https://bibliotekanauki.pl/articles/1818207.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Stowarzyszenie Elektryków Polskich
Tematy:
infrared detector
T2SLs
superlattice
III-V materials
I-V characteristics
Opis:
Numerical analysis of the dark current (Id) in the type-II superlattice (T2SL) barrier (nBn) detector operated at high temperatures was presented. Theoretical calculations were compared with the experimental results for the nBn detector with the absorber and contact layers in an InAs/InAsSb superlattice separated AlAsSb barrier. Detector structure was grown using MBE technique on a GaAs substrate. The k·p model was used to determine the first electron band and the first heavy and light hole bands in T2SL, as well as to calculate the absorption coefficient. The paper presents the effect of the additional hole barrier on electrical and optical parameters of the nBn structure. According to the principle of the nBn detector operation, the electrons barrier is to prevent the current flow from the contact layer to the absorber, while the holes barrier should be low enough to ensure the flow of optically generated carriers. The barrier height in the valence band (VB) was adjusted by changing the electron affinity of a ternary AlAsSb material. Results of numerical calculations similar to the experimental data were obtained, assuming the presence of a high barrier in VB which, at the same time, lowered the detector current responsivity.
Źródło:
Opto-Electronics Review; 2021, 29, 1; 1--4
1230-3402
Pojawia się w:
Opto-Electronics Review
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Barrier in the valence band in the nBn detector with an active layer from the type-II superlattice
Autorzy:
Kopytko, Małgorzata
Gomółka, Emilia
Manyk, Tetiana
Michalczewski, Krystian
Kubiszyn, Łukasz
Rutkowski, Jaroslaw
Martyniuk, Piotr
Powiązania:
https://bibliotekanauki.pl/articles/1818204.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Stowarzyszenie Elektryków Polskich
Tematy:
infrared detector
T2SLs
superlattice
III-V materials
I-V characteristics
Opis:
Numerical analysis of the dark current (Id) in the type-II superlattice (T2SL) barrier (nBn) detector operated at high temperatures was presented. Theoretical calculations were compared with the experimental results for the nBn detector with the absorber and contact layers in an InAs/InAsSb superlattice separated AlAsSb barrier. Detector structure was grown using MBE technique on a GaAs substrate. The k·p model was used to determine the first electron band and the first heavy and light hole bands in T2SL, as well as to calculate the absorption coefficient. The paper presents the effect of the additional hole barrier on electrical and optical parameters of the nBn structure. According to the principle of the nBn detector operation, the electrons barrier is to prevent the current flow from the contact layer to the absorber, while the holes barrier should be low enough to ensure the flow of optically generated carriers. The barrier height in the valence band (VB) was adjusted by changing the electron affinity of a ternary AlAsSb material. Results of numerical calculations similar to the experimental data were obtained, assuming the presence of a high barrier in VB which, at the same time, lowered the detector current responsivity.
Źródło:
Opto-Electronics Review; 2021, 29, 1; 1--4
1230-3402
Pojawia się w:
Opto-Electronics Review
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Multi-technique characterisation of InAs-on-GaAs wafers with circular defect pattern
Autorzy:
Boguski, Jacek
Wróbel, Jarosław
Złotnik, Sebastian
Budner, Bogusław
Liszewska, Malwina
Kubiszyn, Łukasz
Michałowski, Paweł P.
Ciura, Łukasz
Moszczyński, Paweł
Odrzywolski, Sebastian
Jankiewicz, Bartłomiej
Wróbel, Jerzy
Powiązania:
https://bibliotekanauki.pl/articles/2204219.pdf
Data publikacji:
2023
Wydawca:
Polska Akademia Nauk. Stowarzyszenie Elektryków Polskich
Tematy:
wafer homogeneity
wafer defect pattern
surface roughness
indium arsenide
beryllium doping
Opis:
The article presents the results of diameter mapping for circular-symmetric disturbance of homogeneity of epitaxially grown InAs (100) layers on GaAs substrates. The set of acceptors (beryllium) doped InAs epilayers was studied in order to evaluate the impact of Be doping on the 2-inch InAs-on-GaAs wafers quality. During the initial identification of size and shape of the circular pattern, non-destructive optical techniques were used, showing a 100% difference in average roughness between the wafer centre and its outer part. On the other hand, no volumetric (bulk) differences are detectable using Raman spectroscopy and highresolution X-ray diffraction. The correlation between Be doping level and circular defect pattern surface area has been found.
Źródło:
Opto-Electronics Review; 2023, 31, Special Issue; art. no. e144564
1230-3402
Pojawia się w:
Opto-Electronics Review
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-3 z 3

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