The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon

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Opis

Tytuł:: The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon
Autorzy:: Al-Obaidi, H. N.
Khaleel, I. H.
Powiązania:: https://bibliotekanauki.pl/articles/411880.pdf
Data publikacji:: 2013
Wydawca:: Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:: scanning electron microscope
Electron Beam Current
Electron Mirror Images
Źródło:: International Letters of Chemistry, Physics and Astronomy; 2013, 10, 1; 70-75
2299-3843
Język:: angielski
Prawa:: CC BY: Creative Commons Uznanie autorstwa 4.0
Dostawca treści:: Biblioteka Nauki
: Artykuł

Przejdź do źródła

A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that associated with electron beam is derived. The results clearly shows that the beam current could be used to enhance or conversely deteriorate the phenomena of mirror effect. So this work procedure may consider to be tool controllable of this phenomena for investigation purposes.

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