One dimensional kinetic model of CMM passive scanning probes

Scanning probes, also known as measuring probes, are one of the most used solution for coordinate measuring machines (CMM), because of ability to collect large amount of measuring points as well as fast measurements. Fast measurement and accuracy of measuring system have recently determined two critical parameters which decide about effectiveness of the machine. Dynamic is the most significant factor limiting accuracy of measurement. Majority of research into scanning CMM does not separate the performance of the probing system from the other error sources of the machines, so a real error influenced by the probing system is not deeply determined. This paper presents the scanning probe model regardless the machine links. Determined model makes possible to better understand the probing process with higher speeds and optimize the measuring process. Finally (future work), optimization algorithms will be proposed and applied to the probing system and the result will be improved accuracy.