Positron Lifetime Spectroscopy of Nanocrystalline Copper

Positron lifetime spectroscopy was applied to investigate the thermal stability of nanocrystalline copper prepared by severe plastic torsion deformation. Positrons annihilating in as prepared specimens exhibited free positron component τ$\text{}_{1}$ and two defect components τ$\text{}_{2}$=164 ps and τ$\text{}_{3}$=255 ps. Evolution of the lifetimes and relative intensities of all the three components with increasing annealing temperature during step-by-step isochronal annealing up to 630°C was studied. Behaviour of positrons in nanocrystalline copper could not be interpreted in the frame of conventional 3-state trapping model due to highly inhomogeneous defect distribution. Therefore a modified trapping model was developed and applied to explain the experimental results.