Dimensional Crossovers in Magnetoresistance of Submicron Films and Wires of CdTe:In

We present millikelvin studies of magnetoresistance for epitaxial films and wires of CdTe:In. In comparison to the data with theoretical predictions for the weakly localized regime we put into the evidence the presence of the temperature-induced dimensional crossovers in the studied systems. Our measurements probe the electron phase-breaking rate and indicate that the main dephasing mechanism arises from electron scattering from thermal fluctuations of three- or two-dimensional electron liquid.