Thin Films Investigations by Means of Spin-Wave Resonance

Magnetic resonance technique may successfully be applied to determine some basic parameters such as g-factor, magnetization M$\text{}_{s}$ or anisotropy energy constant K$\text{}_{u}$ in thin magnetic films. These parameters are obtained from a ferromagnetic resonance experiment when uniform precession of M$\text{}_{s}$ takes place. From spin-wave resonance one may extract very valuable information on the exchange constant A or the surface conditions characterized by the surface anisotropy energy (or pinning parameters ρ). In fact, it is only spin-wave resonance or similar techniques which allow for measurements of A, ρ or the coupling constant K$\text{}_{c}$ between ferromagnetic sublayers in multi-layered structure. The magnetic phase diagram, temperature dependence of the spin-waves stiffness constant, and the anisotropy energy constant may also be listed as less common examples of spin-wave resonance technique application for the investigation of thin films. This paper presents a theoretical approach to typical examples of experimental results and their interpretation from spin-wave resonance measurements.