Demonstrator testera wbudowanego BIST dla układów w pełni różnicowych

Przedstawiono demonstrator testera wbudowanego, przeznaczony do pracy na stanowisku dydaktycznym w laboratorium z przedmiotu Zaawansowane Metody Pomiarowe i Diagnostyczne. Na stanowisku studenci zapoznają się z technologią BIST (ang. Built-In Self-Test), która jest przykładem wdrożenia strategii projektowania dla testowania.

A demonstrator of Built-In Self-Tester (BIST) for testing and diagnosis of fully differential circuits is presented. The demonstrator works on the educational stand in the Laboratory of Advanced Measurement and Diagnostic Methods, where students are familiarized with BIST technology, which is an example of implementation of Design-for-Test strategy. In the BIST, a testing method is applied, which employs the excitation of the circuit under test by a common-mode signal. Fault location is performed with use of a fault dictionary. Laboratory tasks include: fault detection, analysis and validation of diagnostic method, fault dictionary construction, fault location and calculation of test quality metrics. Students evaluate test quality metrics using a probabilistic approach to the analysis of measurement process in accordance with guidance provided by the Joint Committee for Guides in Metrology (JCGM) in “Evaluation of measurement data – The role of measurement uncertainty in conformity assessment” JCGM 106: 2012.