Effect of Thickness on Magnetic Properties of $Fe_{36}Co_{36}B_{19.2}Si_{4.8}Mo_2W_2$ Thin Film Prepared by Thermionic Vacuum Arc

$Fe_{36}Co_{36}B_{19.2}Si_{4.8}Mo_2W_2$ amorphous thin films have been produced by thermionic vacuum arc with thickness varying from 200 nm to 260 nm. X-ray diffraction has been employed to reveal a predominant amorphous phase in the as-prepared samples, although a small crystalline fraction cannot be excluded. The bulk magnetic properties of thin films were examined at room temperature using an ADE Magnetics EV9 vibrating sample magnetometer with maximum magnetic field strength of 1750 kA/m, real-time field control and dynamic gauss range capable of reaching a resolution of 0.08 A/m at low fields. The minimum value of the coercivity for the as-prepared samples was about 7 kA/m.