The Optical and Surface Morphology Properties of AgInTe2

AgInTe2 (AIT) thin films prepared by using vacuum thermal evaporation technique, of thickness 150 nm, with deposition rate 1.8±0.2 nm/sec on glass of substrate with pressure (10-5) mbar and at room temperature. In the range 473-673 K all samples has been heat treatment. The AIT properties of optical thin films would been studied like (coefficient of absorption, index of refractive, coefficient of extinction, real and imaginary dielectric constant) by using Measurement spectra of absorption and transmission. Results of the optical constants showed that it is wide applications as an photovoltaic applications and optoelectronic devices.